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Journal Articles

Impact of the angle of incidence on negative muon-induced SEU cross sections of 65-nm Bulk and FDSOI SRAMs

Liao, W.*; Hashimoto, Masanori*; Manabe, Seiya*; Watanabe, Yukinobu*; Abe, Shinichiro; Tampo, Motonobu*; Takeshita, Soshi*; Miyake, Yasuhiro*

IEEE Transactions on Nuclear Science, 67(7), p.1566 - 1572, 2020/07

 Times Cited Count:0 Percentile:0.01(Engineering, Electrical & Electronic)

Muon-induced single event upset (SEU) is predicted to increase with technology scaling. The angle of incidence of terrestrial muons is not always perpendicular to the chip surface. Consequently, the impact of the angle of incidence of muons on SEUs should be evaluated. This study conducts negative muon irradiation tests on bulk SRAM and FDSOI SRAM at two angles of incidence: 0 degree (vertical) and 45 degree (tilted). The tilted incidence drifts the muon energy peak to a higher energy. Moreover, the SEU characteristics (i.e., such as the voltage dependences of the SEU cross sections and multiple cells upset patterns) between the vertical and tilted incidences are similar.

Journal Articles

Transient currents induced in MOS capacitors by ion irradiation; Influence of incident angle of ions and device temperature

Yamakawa, Takeshi; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Wakasa, Takeshi; Shibata, Toshihiko*; Kamiya, Tomihiro

JAERI-Review 2004-025, TIARA Annual Report 2003, p.19 - 20, 2004/11

no abstracts in English

Journal Articles

Upgrade of ECH system in JT-60U featuring an antenna for toroidal/poloidal beam scan

Moriyama, Shinichi; Ikeda, Yoshitaka; Kajiwara, Ken; Seki, Masami; Sakamoto, Keishi; Takahashi, Koji; Imai, Tsuyoshi; Fujii, Tsuneyuki; JT-60 Team

AIP Conference Proceedings 595, p.322 - 325, 2001/11

no abstracts in English

Journal Articles

Study of ripple loss of fast ions with ferritic insertion on JFT-2M

Kawashima, Hisato; Tsuzuki, Kazuhiro; Isei, Nobuaki; Sato, Masayasu; Shinohara, Koji; Kimura, Haruyuki

Europhysics Conference Abstracts (CD-ROM), 25A, p.1337 - 1340, 2001/00

no abstracts in English

Journal Articles

Development of a detector for measuring effective dose (equivalent) for external photon exposures in natural environment

Tsutsumi, Masahiro; Saito, Kimiaki; Moriuchi, Shigeru*

Journal of Nuclear Science and Technology, 37(3), p.300 - 306, 2000/03

no abstracts in English

Journal Articles

Temperature and angular dependences of sputtering yield of B$$_{4}$$C-carbon fiber composite irradiated with low energy deuterium ions

Jimbo, Ryutaro*; Nakamura, Kazuyuki; Bandourko, V.*; Dairaku, Masayuki; Okumura, Yoshikazu; Akiba, Masato

Journal of Nuclear Materials, 266-269, p.1103 - 1107, 1999/00

 Times Cited Count:5 Percentile:40.57(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Temperature dependence of sputtering yield of carbon fiber-reinforced carbon composites with low energy and high flux deuterium ions

Jimbo, Ryutaro*; Nakamura, Kazuyuki; Bandourko, V.*; Okumura, Yoshikazu; Akiba, Masato

Journal of Nuclear Materials, 258-263, p.724 - 728, 1998/00

 Times Cited Count:8 Percentile:57.22(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Monte Carlo calculations on the passage of electrons through thin films irradiated by 300keV electrons

*; *; *;

IEICE Trans. Electron., E78-C(5), p.557 - 563, 1995/05

no abstracts in English

JAEA Reports

Sputtering Yield Measurement and Surface Observation of Molybdenum Honeycomb Walls

; ; Nakamura, H.

JAERI-M 7216, 34 Pages, 1977/08

JAERI-M-7216.pdf:4.71MB

no abstracts in English

JAEA Reports

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