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Liao, W.*; Hashimoto, Masanori*; Manabe, Seiya*; Watanabe, Yukinobu*; Abe, Shinichiro; Tampo, Motonobu*; Takeshita, Soshi*; Miyake, Yasuhiro*
IEEE Transactions on Nuclear Science, 67(7), p.1566 - 1572, 2020/07
Times Cited Count:0 Percentile:0.01(Engineering, Electrical & Electronic)Muon-induced single event upset (SEU) is predicted to increase with technology scaling. The angle of incidence of terrestrial muons is not always perpendicular to the chip surface. Consequently, the impact of the angle of incidence of muons on SEUs should be evaluated. This study conducts negative muon irradiation tests on bulk SRAM and FDSOI SRAM at two angles of incidence: 0 degree (vertical) and 45 degree (tilted). The tilted incidence drifts the muon energy peak to a higher energy. Moreover, the SEU characteristics (i.e., such as the voltage dependences of the SEU cross sections and multiple cells upset patterns) between the vertical and tilted incidences are similar.
Yamakawa, Takeshi; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Wakasa, Takeshi; Shibata, Toshihiko*; Kamiya, Tomihiro
JAERI-Review 2004-025, TIARA Annual Report 2003, p.19 - 20, 2004/11
no abstracts in English
Moriyama, Shinichi; Ikeda, Yoshitaka; Kajiwara, Ken; Seki, Masami; Sakamoto, Keishi; Takahashi, Koji; Imai, Tsuyoshi; Fujii, Tsuneyuki; JT-60 Team
AIP Conference Proceedings 595, p.322 - 325, 2001/11
no abstracts in English
Kawashima, Hisato; Tsuzuki, Kazuhiro; Isei, Nobuaki; Sato, Masayasu; Shinohara, Koji; Kimura, Haruyuki
Europhysics Conference Abstracts (CD-ROM), 25A, p.1337 - 1340, 2001/00
no abstracts in English
Tsutsumi, Masahiro; Saito, Kimiaki; Moriuchi, Shigeru*
Journal of Nuclear Science and Technology, 37(3), p.300 - 306, 2000/03
no abstracts in English
Jimbo, Ryutaro*; Nakamura, Kazuyuki; Bandourko, V.*; Dairaku, Masayuki; Okumura, Yoshikazu; Akiba, Masato
Journal of Nuclear Materials, 266-269, p.1103 - 1107, 1999/00
Times Cited Count:5 Percentile:40.57(Materials Science, Multidisciplinary)no abstracts in English
Jimbo, Ryutaro*; Nakamura, Kazuyuki; Bandourko, V.*; Okumura, Yoshikazu; Akiba, Masato
Journal of Nuclear Materials, 258-263, p.724 - 728, 1998/00
Times Cited Count:8 Percentile:57.22(Materials Science, Multidisciplinary)no abstracts in English
*; *; *;
IEICE Trans. Electron., E78-C(5), p.557 - 563, 1995/05
no abstracts in English
; ; Nakamura, H.
JAERI-M 7216, 34 Pages, 1977/08
no abstracts in English
JAERI-M 6384, 12 Pages, 1976/01
no abstracts in English